src/corelibs: Extended test for GPIO reinit.

Signed-off-by: IFX-Anusha <[email protected]>

Author: IFX-Anusha

src/corelibs/digitalio/test_digitalio_single.cpp

@@ -37,6 +37,12 @@ const uint8_t INVALID_PIN = 255;
 TEST_GROUP(digitalio_single);
 TEST_GROUP(digitalio_single_internal);
 
+volatile bool interrupt_triggered = false;
+
+void test_pin_interrupt_handler() {
+    interrupt_triggered = true;
+}
+
 /**
  * @brief Setup method called by Unity before every test in this test group.
  */
@@ -62,6 +68,7 @@ TEST_IFX(digitalio_single_internal, test_digitalio_read_write_input_normal)
 
     digitalWrite(TEST_PIN_DIGITAL_IO_OUTPUT, HIGH);
     TEST_ASSERT_EQUAL_MESSAGE(HIGH, digitalRead(TEST_PIN_DIGITAL_IO_INPUT), "Input Pin should be set to HIGH");
+
     digitalWrite(TEST_PIN_DIGITAL_IO_OUTPUT, LOW);
     TEST_ASSERT_EQUAL_MESSAGE(LOW, digitalRead(TEST_PIN_DIGITAL_IO_INPUT), "Input Pin should be set to LOW");
 }
@@ -77,11 +84,11 @@ TEST_IFX(digitalio_single_internal, test_digitalio_read_write_input_pullup)
     pinMode(TEST_PIN_DIGITAL_IO_OUTPUT, OUTPUT_OPENDRAIN);
     pinMode(TEST_PIN_DIGITAL_IO_INPUT, INPUT_PULLUP);
 
-    digitalWrite(TEST_PIN_DIGITAL_IO_OUTPUT, HIGH); // set output pin to HIGH ie, floating state
-    TEST_ASSERT_EQUAL_MESSAGE(HIGH, digitalRead(TEST_PIN_DIGITAL_IO_INPUT), "Input Pin should be set to HIGH initially");
-
     digitalWrite(TEST_PIN_DIGITAL_IO_OUTPUT, LOW);
     TEST_ASSERT_EQUAL_MESSAGE(LOW, digitalRead(TEST_PIN_DIGITAL_IO_INPUT), "Input Pin should be set to LOW");
+
+    digitalWrite(TEST_PIN_DIGITAL_IO_OUTPUT, HIGH); // set output pin to HIGH ie, floating state
+    TEST_ASSERT_EQUAL_MESSAGE(HIGH, digitalRead(TEST_PIN_DIGITAL_IO_INPUT), "Input Pin should be set to HIGH when output is floating and input is pullup");
 }
 
 /**
@@ -97,8 +104,8 @@ TEST_IFX(digitalio_single_internal, test_digitalio_read_write_input_pulldown)
 
     TEST_ASSERT_EQUAL_MESSAGE(LOW, digitalRead(TEST_PIN_DIGITAL_IO_INPUT), "Input Pin should be set to LOW initially");
 
-    digitalWrite(TEST_PIN_DIGITAL_IO_OUTPUT, HIGH);
-    // Skip assert as it may not be set to HIGH due to open-drain configuration
+    digitalWrite(TEST_PIN_DIGITAL_IO_OUTPUT, HIGH);// set output pin to HIGH ie, floating state
+    TEST_ASSERT_EQUAL_MESSAGE(LOW, digitalRead(TEST_PIN_DIGITAL_IO_INPUT), "Input Pin should be LOW when output is floating and input is pulldown");
 
     digitalWrite(TEST_PIN_DIGITAL_IO_OUTPUT, LOW);
     TEST_ASSERT_EQUAL_MESSAGE(LOW, digitalRead(TEST_PIN_DIGITAL_IO_INPUT), "Input Pin should be set to LOW");
@@ -155,21 +162,47 @@ TEST_IFX(digitalio_single_internal, test_invalid_pinmode) {
     // No assertion as pinMode doesn't return a value, but ensure no crash
 }
 
+/**
+ * @brief Test switching pinmode from OUTPUT to INPUT_PULLUP. 
+ * Here an interrupt is attached to the input pin to check if it gets triggered on state change.
+ * This is to ensure that when the init pin value remains unchanged, underlying reconfigure function is used and there is no state change.
+ * 
+ *  @note: Assumption is made that TEST_PIN_DIGITAL_IO_OUTPUT is connected to TEST_PIN_DIGITAL_IO_INPUT
+ *       for the test cases to work as expected.
+ */
+
+TEST_IFX(digitalio_single_internal, test_switch_input_output)
+{    
+    pinMode(TEST_PIN_DIGITAL_IO_OUTPUT, OUTPUT);
+    pinMode(TEST_PIN_DIGITAL_IO_INPUT, INPUT);
+    digitalWrite(TEST_PIN_DIGITAL_IO_OUTPUT, HIGH);
+
+    interrupt_triggered = false;
+    attachInterrupt(digitalPinToInterrupt(TEST_PIN_DIGITAL_IO_INPUT), test_pin_interrupt_handler, CHANGE);
+
+    pinMode(TEST_PIN_DIGITAL_IO_OUTPUT, INPUT_PULLUP);
+
+    TEST_ASSERT_FALSE_MESSAGE(interrupt_triggered, "Interrupt should not have been triggered on state change");
+}
+
 /**
  * @brief Test group runner to run all test cases in this group.
  */
 static TEST_GROUP_RUNNER(digitalio_single_internal)
-{
+{       
     RUN_TEST_CASE(digitalio_single_internal, test_digitalio_read_write_input_normal);
     RUN_TEST_CASE(digitalio_single_internal, test_digitalio_read_write_input_pullup);
     RUN_TEST_CASE(digitalio_single_internal, test_digitalio_read_write_input_pulldown);
     RUN_TEST_CASE(digitalio_single_internal, test_digitalio_read_write_output_opendrain);
+
 #if !defined(ARDUINO_ARCH_XMC)   
     RUN_TEST_CASE(digitalio_single_internal, test_pinMode_invalid_pin);
     RUN_TEST_CASE(digitalio_single_internal, test_digitalWrite_invalid_pin);
     RUN_TEST_CASE(digitalio_single_internal, test_digitalRead_invalid_pin);
     RUN_TEST_CASE(digitalio_single_internal, test_invalid_pinmode);
 #endif // ARDUINO_ARCH_XMC skip these tests.
+
+    RUN_TEST_CASE(digitalio_single_internal, test_switch_input_output);
 }
 
 /**